(MENAFN- PR Newswire) MILPITAS, Calif., Feb. 24, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC ) announced the Archer™ 750 imaging-based overlay metrology system and the SpectraShape™ 11k ...
“Leading-edge device manufacturers are facing extremely tight patterning specifications,” said Oreste Donzella, chief marketing officer at KLA-Tencor. “To understand patterning errors, chipmakers need ...
Two new tools from KLA-Tencor—the SpectraShape 9000 optical critical-dimension metrology system and the BDR300 backside-defect inspection and review module—enable volume production of integrated ...
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